{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1010000781637383819.json","@type":"Article","resourceType":"学術雑誌論文(journal article)","dc:title":[{"@language":"ja","@value":"Simultaneous Measurements of Drain-to-Source Current and Carrier Injection Properties of Top-Contact Pentacene Thin-Film Transistors"}],"publication":{"prism:publicationName":[{"@language":"ja","@value":"Japanese Journal of Applied Physics 46"}],"prism:publicationDate":"2007","prism:startingPage":"390","prism:endingPage":"393"},"project":[{"@id":"https://cir.nii.ac.jp/crid/1040000781637383808","@type":"Project","projectIdentifier":[{"@type":"KAKEN","@value":"06J05721"},{"@type":"JGN","@value":"JP06J05721"},{"@type":"URI","@value":"https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-06J05721/"}],"notation":[{"@language":"ja","@value":"金属内包フラーレンと自己組織化単分子膜を用いた単一分子スイッチ素子の創製"}]}],"dataSourceIdentifier":[{"@type":"KAKEN","@value":"PRODUCT-9207167"}]}