Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator
書誌事項
- タイトル
- Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator
- 著者
- T. An, T. Nishio, T. Eguchi, et al.
収録刊行物
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- Review of Scientific Instruments 79
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Review of Scientific Instruments 79 33703-, 2008