著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,New method for Characterizing Dielectric Properties of High-k Films Using Time-Dependent Open-Circuit Potential Measurement,Ext.Abst.Int.Conf. Solid State Dev.Mater. (SSDM),,,2002,,,66-67,https://cir.nii.ac.jp/crid/1010000781772371840,