著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,High-speed and Accurate Profile Measurement and Defect by Scanning Moire Method Using Linear Sensors,"Journal of JSNDI Vol.51, No.7, Inspection",,,2002,,,420-424,https://cir.nii.ac.jp/crid/1010000781776676618,