Deep-level effects on slow current transients and current collapse in GaN MESFETs
書誌事項
- タイトル
- Deep-level effects on slow current transients and current collapse in GaN MESFETs
- 著者
- K.Yonemoto, K.Horio
収録刊行物
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- Proceedings of IEEE SIMC-XIII (印刷中)
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Proceedings of IEEE SIMC-XIII (印刷中) 2005
