著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,High-Resolution Anger Depth Profiling by sub-keV Ion Sputlering,Surf.& Interf.Anal. 37,,,2005,,,167-170,https://cir.nii.ac.jp/crid/1010000781812556800,