Polarized radiation thermometry of silicon wafers at high temperature
書誌事項
- タイトル
- Polarized radiation thermometry of silicon wafers at high temperature
- 著者
- T.Ohkubo, T.Iuchi
収録刊行物
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- Proc.of SICE2004 August Sapporo
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Proc.of SICE2004 August Sapporo 654-657, 2004