著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,Polarized radiation thermometry of silicon wafers at high temperature,Proc.of SICE2004 August Sapporo,,,2004,,,654-657,https://cir.nii.ac.jp/crid/1010000781813027970,