Evaluation of Bi defect concentration in LnO1-xFxBiCh2 by scanning tunneling microscopy
書誌事項
- タイトル
- Evaluation of Bi defect concentration in LnO1-xFxBiCh2 by scanning tunneling microscopy
- 著者
- S. Demura, N. Ishida, Y. Fujisawa and H. Sakata
収録刊行物
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- Physics Procedia
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Physics Procedia 印刷中 2017
