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Pattern Partitioning based Field Testing for Improving the Detection Latency of Aging-induced Delay Faults
Bibliographic Information
- Title
- Pattern Partitioning based Field Testing for Improving the Detection Latency of Aging-induced Delay Faults
- Author
- H.T. Al-Awadhi, S. Wang, Y. Higami, H. Takahashi
Journal
-
- International Technical Conference on Circuits/Systems, Computers and Communications
-
International Technical Conference on Circuits/Systems, Computers and Communications - 1-4, 2017
- Tweet
Details 詳細情報について
-
- CRID
- 1010000781906141955
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN