Pattern Partitioning based Field Testing for Improving the Detection Latency of Aging-induced Delay Faults

Bibliographic Information

Title
Pattern Partitioning based Field Testing for Improving the Detection Latency of Aging-induced Delay Faults
Author
H.T. Al-Awadhi, S. Wang, Y. Higami, H. Takahashi

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Details 詳細情報について

  • CRID
    1010000781906141955
  • Article Type
    journal article
  • Data Source
    • KAKEN

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