著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,Threshold Current Density of Electromigration Damage in Angled Polycrystalline Line,Key Engineering Materials 353-358,,,2007,,,2958-2961,https://cir.nii.ac.jp/crid/1010000781933359634,