Selective Low-Care Coding:A Means for Test Data Compression in Circuits with Multiple Scan Chains

Bibliographic Information

Title
Selective Low-Care Coding:A Means for Test Data Compression in Circuits with Multiple Scan Chains
Author
Youhua Shi, Nozomu Togawa, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki

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Details 詳細情報について

  • CRID
    1010000781936749312
  • Article Type
    journal article
  • Data Source
    • KAKEN

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