Selective Low-Care Coding:A Means for Test Data Compression in Circuits with Multiple Scan Chains
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- 木村 晋二
- 早稲田大学
書誌事項
- タイトル
- Selective Low-Care Coding:A Means for Test Data Compression in Circuits with Multiple Scan Chains
- 著者
- Youhua Shi, Nozomu Togawa, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki
収録刊行物
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- IEICE Trans.Fundamentals E91-A
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IEICE Trans.Fundamentals E91-A 996-1004, 2006