- 【Updated on May 12, 2025】 Integration of CiNii Dissertations and CiNii Books into CiNii Research
- Trial version of CiNii Research Knowledge Graph Search feature is available on CiNii Labs
- 【Updated on June 30, 2025】Suspension and deletion of data provided by Nikkei BP
- Regarding the recording of “Research Data” and “Evidence Data”
Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation
Bibliographic Information
- Title
- Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation
- Author
- H.Ohyama et al.
Journal
-
- Physica B 376-377
-
Physica B 376-377 382-384, 2006
- Tweet
Details 詳細情報について
-
- CRID
- 1010000781940908298
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN