[Updated on Apr. 18] Integration of CiNii Articles into CiNii Research

Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation

Bibliographic Information

Title
Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation
Author
H.Ohyama et al.

Journal

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Details

  • CRID
    1010000781940908298
  • Article Type
    journal article
  • Data Source
    • KAKEN

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