Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation
Bibliographic Information
- Title
- Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation
- Author
- H.Ohyama et al.
Journal
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- Physica B 376-377
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Physica B 376-377 382-384, 2006
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Details
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- CRID
- 1010000781940908298
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- Article Type
- journal article
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- Data Source
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- KAKEN