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Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation
Bibliographic Information
- Title
- Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation
- Author
- H.Ohyama et al.
Journal
-
- Physica B 376-377
-
Physica B 376-377 382-384, 2006
- Tweet
Details 詳細情報について
-
- CRID
- 1010000781940908298
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN