[Updated on Apr. 18] Integration of CiNii Articles into CiNii Research

An approach to reduce over-testing of path delay faults in data paths using RT-level information

Bibliographic Information

Title
An approach to reduce over-testing of path delay faults in data paths using RT-level information
Author
Yuki Yoshikawa, Satoshi Ohtake, Hideo Fujiwara

Journal

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Details

  • CRID
    1010000781949030662
  • Article Type
    journal article
  • Data Source
    • KAKEN

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