著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,An approach to reduce over-testing of path delay faults in data paths using RT-level information,11th IEEE European Test Symposium,,,2006,,,146-151,https://cir.nii.ac.jp/crid/1010000781949030662,