An approach to reduce over-testing of path delay faults in data paths using RT-level information
書誌事項
- タイトル
- An approach to reduce over-testing of path delay faults in data paths using RT-level information
- 著者
- Yuki Yoshikawa, Satoshi Ohtake, Hideo Fujiwara
収録刊行物
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- 11th IEEE European Test Symposium
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11th IEEE European Test Symposium 146-151, 2006
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詳細情報
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- CRID
- 1010000781949030662
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- 資料種別
- journal article
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- データソース種別
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- KAKEN