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Critical Angle Behavior of Exchane Bias and Coercivity in CoFe/MnIr Bilayers
Bibliographic Information
- Title
- Critical Angle Behavior of Exchane Bias and Coercivity in CoFe/MnIr Bilayers
- Author
- D. Y. Kim
- Published
- 2006
- Resource Type
- journal article
Journal
-
- IEEE Transaction on Magnetics 42
-
IEEE Transaction on Magnetics 42 3011-3013, 2006
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Details 詳細情報について
-
- CRID
- 1010000781978451462
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN
