Critical Angle Behavior of Exchane Bias and Coercivity in CoFe/MnIr Bilayers
書誌事項
- タイトル
- Critical Angle Behavior of Exchane Bias and Coercivity in CoFe/MnIr Bilayers
- 著者
- D. Y. Kim
- 公開日
- 2006
- 資源種別
- journal article
収録刊行物
-
- IEEE Transaction on Magnetics 42
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IEEE Transaction on Magnetics 42 3011-3013, 2006
