Recent Novel X-ray Reflectivity Techniques : Moving Towards Quicker Measurement to observe Changes at Surface and Buried Interfaces
書誌事項
- タイトル
- Recent Novel X-ray Reflectivity Techniques : Moving Towards Quicker Measurement to observe Changes at Surface and Buried Interfaces
- 著者
- K.Sakurai, M.Mizusawa, M.Ishii
収録刊行物
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- Transactions of the Materials Research Society of Japan 32
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Transactions of the Materials Research Society of Japan 32 181-, 2007
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詳細情報
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- CRID
- 1010000781986125184
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- 資料種別
- journal article
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- データソース種別
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- KAKEN