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Origin of the Hole Current in n-type High-k/Metal Gate Stacks Field Effect Transistor in and Inversion State
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- 山部 紀久夫
- University of Tsukuba
Bibliographic Information
- Title
- Origin of the Hole Current in n-type High-k/Metal Gate Stacks Field Effect Transistor in and Inversion State
- Author
- Motoyuki Sato, Kikuo Yamabe, Takayuki Aoyama, Yasuo Nara, and Yuzuru Ohji
Journal
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- Jpn.J.Appl.Phys 46
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Jpn.J.Appl.Phys 46 2007
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Details 詳細情報について
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- CRID
- 1010000782007200906
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- Article Type
- journal article
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- Data Source
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- KAKEN