著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,Electrical and Structural Evaluations of Ultrathin SiGe and Ge-on-insulator Fabricated Using Ge Condensation by Dry Oxidation,Extended Abstracts of the 2008 International ronference on Solid State Devices and Materials,,,2008,,,438-439,https://cir.nii.ac.jp/crid/1010000782026200600,