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X-ray diffraction and infrared multiple-angle incidence resolution spectroscopic studies on the crystal structure and molecular orientation of Zinc-porphyrin thin films on a SiO_2/Si substrate
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- HASEGAWA Takeshi
- Tokyo Institute of Technology
Bibliographic Information
- Title
- X-ray diffraction and infrared multiple-angle incidence resolution spectroscopic studies on the crystal structure and molecular orientation of Zinc-porphyrin thin films on a SiO_2/Si substrate
- Author
- Sou Ryuzaki, Takeshi Hasegawa, Jun Onoe
- Published
- 2009
- Resource Type
- journal article
Journal
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- J.Appl.Phys. 105
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J.Appl.Phys. 105 2009
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Details 詳細情報について
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- CRID
- 1010000782034585607
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- Article Type
- journal article
-
- Data Source
-
- KAKEN
