X-ray diffraction and infrared multiple-angle incidence resolution spectroscopic studies on the crystal structure and molecular orientation of Zinc-porphyrin thin films on a SiO_2/Si substrate
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- 長谷川 健
- 東京工業大学
書誌事項
- タイトル
- X-ray diffraction and infrared multiple-angle incidence resolution spectroscopic studies on the crystal structure and molecular orientation of Zinc-porphyrin thin films on a SiO_2/Si substrate
- 著者
- Sou Ryuzaki, Takeshi Hasegawa, Jun Onoe
- 公開日
- 2009
- 資源種別
- journal article
収録刊行物
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- J.Appl.Phys. 105
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J.Appl.Phys. 105 2009
