著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
向井 剛輝,Grazing Incidence X-ray Diffraction Measurements of InAs/GaAs Quantum Dots Using Equipment Available for Laboratories,Journal of Nanoelectronics and Optoelectronics (投稿中),,,2011,,,,https://cir.nii.ac.jp/crid/1010000782040711040,