[Updated on Apr. 18] Integration of CiNii Articles into CiNii Research

Characterization of Electronic Structure of Grain Boundaries in CIGSAbsorber Layers by Kelvin Probe Force Microscopy

Bibliographic Information

Title
Characterization of Electronic Structure of Grain Boundaries in CIGSAbsorber Layers by Kelvin Probe Force Microscopy
Author
T.Fukae, H.Ichiki, H.Kashiwabara, T.Shiota, A.Yamanda, S.Ishizuka, K.Matsubara, S.Niki, Y.Yoshimura, N.Terada

Journal

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Details

  • CRID
    1010000782045213056
  • Article Type
    journal article
  • Data Source
    • KAKEN

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