著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,Characterization of Electronic Structure of Grain Boundaries in CIGSAbsorber Layers by Kelvin Probe Force Microscopy,Proc.26th European Photovoltaic Sci.Engng.Conf.,,,2010,,,3349-3352,https://cir.nii.ac.jp/crid/1010000782045213056,