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Depth profiling of magnetic and atomic structures of ultrathin films by depth-resolved XMCD and XAFS techniques with a sub-nm depth resolution
Bibliographic Information
- Title
- Depth profiling of magnetic and atomic structures of ultrathin films by depth-resolved XMCD and XAFS techniques with a sub-nm depth resolution
- Author
- K.Amemiya, 他
- Published
- 2009
- Resource Type
- journal article
Journal
-
- J.Phys. : Conf.Ser 190
-
J.Phys. : Conf.Ser 190 12108-, 2009
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Details 詳細情報について
-
- CRID
- 1010000782064085142
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN
