High resolution secondary ion mass spectrometry reveals the contrasting subcellular distribution of arsenic and silicon in rice roots

Bibliographic Information

Title
High resolution secondary ion mass spectrometry reveals the contrasting subcellular distribution of arsenic and silicon in rice roots
Author
Moore, K. L., Schroder, M., Wu, Z. C., Martin, B. G. H., Hawes, C. R., Mcgrath, S. P., Hawkesford, M. J., Ma, J. F., Zhao, F. J. Grovenor, C. R. M.
Published
2011
Resource Type
journal article

Journal

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Details 詳細情報について

  • CRID
    1010000782066382980
  • Article Type
    journal article
  • Data Source
    • KAKEN

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