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Roughness Reduction in Polycrystalline Silicon Thin Films Formed by Continuous-Wave Laser Lateral Crystallization with Cap SiO2 Thin Films
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- KUROKI Shin-ichiro
- 東北大学
Bibliographic Information
- Title
- Roughness Reduction in Polycrystalline Silicon Thin Films Formed by Continuous-Wave Laser Lateral Crystallization with Cap SiO2 Thin Films
- Author
- Vol.48Sunichiro Fujii, Shin-Ichiro Kuroki, Masaki Numata, Koji Kotani, and Takashi Ito
Journal
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- Jpn. J. Appl. Phys.
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Jpn. J. Appl. Phys. Vol.48 2009
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Details 詳細情報について
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- CRID
- 1010000782071054088
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- Article Type
- journal article
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- Data Source
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- KAKEN