{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1010000782089798670.json","@type":"Article","resourceType":"学術雑誌論文(journal article)","dc:title":[{"@language":"ja","@value":"Modeling Connector Contact Condition Using a Contact Failure Model with Equivalent Inductance"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1420564276168252672","@type":"Researcher","personIdentifier":[{"@type":"KAKEN_RESEARCHERS","@value":"90323089"},{"@type":"NRID","@value":"1000090323089"},{"@type":"NRID","@value":"9000404229249"},{"@type":"NRID","@value":"9000412001068"},{"@type":"NRID","@value":"9000004796046"},{"@type":"NRID","@value":"9000404294030"},{"@type":"NRID","@value":"9000404309637"},{"@type":"NRID","@value":"9000397851771"},{"@type":"NRID","@value":"9000415083060"},{"@type":"NRID","@value":"9000392872207"},{"@type":"NRID","@value":"9000399806171"},{"@type":"NRID","@value":"9000400187910"},{"@type":"NRID","@value":"9000399842454"},{"@type":"NRID","@value":"9000404302065"},{"@type":"NRID","@value":"9000399248491"},{"@type":"NRID","@value":"9000397849799"},{"@type":"NRID","@value":"9000399842358"},{"@type":"NRID","@value":"9000404302697"},{"@type":"NRID","@value":"9000404310341"},{"@type":"NRID","@value":"9000404302752"},{"@type":"NRID","@value":"9000415149112"},{"@type":"NRID","@value":"9000399842148"},{"@type":"NRID","@value":"9000404239270"},{"@type":"NRID","@value":"9000409849520"},{"@type":"NRID","@value":"9000404099208"},{"@type":"NRID","@value":"9000415208856"},{"@type":"NRID","@value":"9000404239319"},{"@type":"NRID","@value":"9000400188146"},{"@type":"NRID","@value":"9000404309639"},{"@type":"NRID","@value":"9000399842547"},{"@type":"NRID","@value":"9000404302701"},{"@type":"NRID","@value":"9000404309641"},{"@type":"NRID","@value":"9000398137571"},{"@type":"NRID","@value":"9000397850690"},{"@type":"NRID","@value":"9000415212127"},{"@type":"NRID","@value":"9000398574018"},{"@type":"NRID","@value":"9000398261662"},{"@type":"NRID","@value":"9000400188086"},{"@type":"NRID","@value":"9000404302693"},{"@type":"RESEARCHMAP","@value":"https://researchmap.jp/takaaki.mizuki"}],"foaf:name":[{"@language":"ja","@value":"水木 敬明"},{"@language":"en","@value":"MIZUKI Takaaki"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"東北大学"}]},{"@id":"https://cir.nii.ac.jp/crid/1420564276173495808","@type":"Researcher","personIdentifier":[{"@type":"KAKEN_RESEARCHERS","@value":"40134019"},{"@type":"NRID","@value":"1000040134019"},{"@type":"NRID","@value":"9000415236567"},{"@type":"NRID","@value":"9000415434658"},{"@type":"NRID","@value":"9000399248492"},{"@type":"NRID","@value":"9000415216199"},{"@type":"NRID","@value":"9000287145504"},{"@type":"NRID","@value":"9000415434660"},{"@type":"NRID","@value":"9000415180487"},{"@type":"NRID","@value":"9000415163323"},{"@type":"NRID","@value":"9000415149114"},{"@type":"NRID","@value":"9000401604737"},{"@type":"NRID","@value":"9000409849521"},{"@type":"NRID","@value":"9000404099209"},{"@type":"NRID","@value":"9000415208857"},{"@type":"NRID","@value":"9000415163746"},{"@type":"NRID","@value":"9000415144527"},{"@type":"NRID","@value":"9000404309642"},{"@type":"NRID","@value":"9000415166928"},{"@type":"NRID","@value":"9000415212129"},{"@type":"NRID","@value":"9000415222087"},{"@type":"NRID","@value":"9000398261663"},{"@type":"NRID","@value":"9000415196701"},{"@type":"RESEARCHMAP","@value":"https://researchmap.jp/sone"}],"foaf:name":[{"@language":"ja","@value":"曽根 秀昭"},{"@language":"en","@value":"SONE Hideaki"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"東北大学"}]}],"publication":{"prism:publicationName":[{"@language":"ja","@value":"IEEE International Symposium on Electromagnetic Compatibility 2010"}],"prism:publicationDate":"2010","prism:startingPage":"743","prism:endingPage":"747"},"reviewed":"true","project":[{"@id":"https://cir.nii.ac.jp/crid/1040000782089798656","@type":"Project","projectIdentifier":[{"@type":"KAKEN","@value":"21656096"},{"@type":"JGN","@value":"JP21656096"},{"@type":"URI","@value":"https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-21656096/"}],"notation":[{"@language":"ja","@value":"低レイヤ低コスト高セキュアな通信プロトコルの開発"},{"@language":"en","@value":"Development of Low-Layer Low-Cost Highly-Secure Communication Protocols"}]}],"dataSourceIdentifier":[{"@type":"KAKEN","@value":"PRODUCT-12981742"}]}