Modeling Connector Contact Condition Using a Contact Failure Model with Equivalent Inductance
書誌事項
- タイトル
- Modeling Connector Contact Condition Using a Contact Failure Model with Equivalent Inductance
- 著者
- Yuichi Hayashi, Songping Wu, Jun Fan, Takaaki Mizuki, Hideaki Sone
- 公開日
- 2010
- 資源種別
- journal article
収録刊行物
-
- IEEE International Symposium on Electromagnetic Compatibility 2010
-
IEEE International Symposium on Electromagnetic Compatibility 2010 743-747, 2010
