著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
難波 一輝,Chiba Scan Delay Fault Testing with Short Test Application Time,Journal of Electronic Testing : Theory and Applications,,,2010,26,,667-677,https://cir.nii.ac.jp/crid/1010000782091696260,