Possibility of forming 18-nm-pitch ultrahigh density fine dot arrays for 2 Tbit/in.2 patterned media using 30-keV electron beam lithography

Bibliographic Information

Title
Possibility of forming 18-nm-pitch ultrahigh density fine dot arrays for 2 Tbit/in.2 patterned media using 30-keV electron beam lithography
Author
S. Hosaka, Y. Tanaka, M. Shirai, Z. Mohamad, Y. Yin
Published
2010
Resource Type
journal article

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Details 詳細情報について

  • CRID
    1010000782092824458
  • Article Type
    journal article
  • Data Source
    • KAKEN

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