A Two-Step In-Class Source Code Plagiarism Detection Method Utilizing Improved CM Algorithm and SIM

Bibliographic Information

Title
A Two-Step In-Class Source Code Plagiarism Detection Method Utilizing Improved CM Algorithm and SIM
Author
Asako Ohno, Hajime Murao
Published
2011
Resource Type
journal article

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Details 詳細情報について

  • CRID
    1010000782099479304
  • Article Type
    journal article
  • Data Source
    • KAKEN

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