[Updated on Apr. 18] Integration of CiNii Articles into CiNii Research

Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment

Bibliographic Information

Title
Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment
Author
Yoshinobu Higami, Hiroshi Takahashi, Shin-ya Kobayashi and Kewal K. Saluja

Journal

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Details

  • CRID
    1010000782247456769
  • Article Type
    journal article
  • Data Source
    • KAKEN

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