著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment,IEICE Transactions on Information and Systems,,,2013,E96-D,,1323-1331,https://cir.nii.ac.jp/crid/1010000782247456769,