Performance of a semiconductor SPECT system: comparison with a conventional Anger-type SPECT instrument.

Bibliographic Information

Title
Performance of a semiconductor SPECT system: comparison with a conventional Anger-type SPECT instrument.
Author
Takahashi Y, Miyagawa M, Nishiyama Y, Ishimura H, Mochizuki T.
Published
2013
Resource Type
journal article

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Details 詳細情報について

  • CRID
    1010000782260642698
  • Article Type
    journal article
  • Data Source
    • KAKEN

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