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.Application of the quantitative-phase and crystal structure simultaneous analysis of the X-ray diffraction data obtained by synchrotron Gandolfi camera system. CP879
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- NAKAMURA Tomoki
- 九州大学
Bibliographic Information
- Title
- .Application of the quantitative-phase and crystal structure simultaneous analysis of the X-ray diffraction data obtained by synchrotron Gandolfi camera system. CP879
- Author
- Tanaka M., Nakamura T., and Noguchi T
- Published
- 2007
- Resource Type
- journal article
Journal
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- Synchrotron Radiation Instrumentation : Ninth International Conference. (ed. Jae-Young Choi and Seugyun Rah), American Institute of Physics
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Synchrotron Radiation Instrumentation : Ninth International Conference. (ed. Jae-Young Choi and Seugyun Rah), American Institute of Physics 1779-1783, 2007
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Details 詳細情報について
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- CRID
- 1010000782434035078
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN
