{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1010000782436664709.json","@type":"Article","resourceType":"学術雑誌論文(journal article)","dc:title":[{"@language":"ja","@value":"Ambient analysis of liquid materials with Wet-SIMS"}],"publication":{"prism:publicationName":[{"@language":"ja","@value":"Nuclear Instruments and Methods in Physics Research B"}],"prism:publicationDate":"2016","prism:volume":"371","prism:startingPage":"189","prism:endingPage":"193","jointInternationalResearch":"false"},"reviewed":"true","dcterms:accessRights":"http://purl.org/coar/access_right/c_abf2","project":[{"@id":"https://cir.nii.ac.jp/crid/1040000782436664576","@type":"Project","projectIdentifier":[{"@type":"KAKEN","@value":"13J02001"},{"@type":"JGN","@value":"JP13J02001"},{"@type":"URI","@value":"https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-13J02001/"}],"notation":[{"@language":"ja","@value":"界面分析のためのスパッタ二次粒子大気圧化学イオン化質量分析法の開発"}]}],"dataSourceIdentifier":[{"@type":"KAKEN","@value":"PRODUCT-20481638"}]}