著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
浦岡 行治,Reliability of low temperature poly-Si Thin Film Transistors with ultrathin gate oxide,"pn. J. Appl. Phys. Vol.46,No.7A",,,2007,,,,https://cir.nii.ac.jp/crid/1010000782440670866,