著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,Hot Carrier Degradation of SiGe/Si Heterointerface and Experimental Estimation of Density of Locally Generated Heterointerface Traps,Jpn.J.Appl.Phys. Vol.46、No.8A,,,2007,,,5015-5020,https://cir.nii.ac.jp/crid/1010000782461448592,