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High resolution X-ray photoelectron spectroscopy study on initial oxidation of 4H-SiC(0001)-(√3x√3)R30° surface

Bibliographic Information

Title
High resolution X-ray photoelectron spectroscopy study on initial oxidation of 4H-SiC(0001)-(√3x√3)R30° surface
Author
S. Takahashi, S. Hatta, A. Yoshigoe, Y. Teraoka, T. Aruga

Journal

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Details

  • CRID
    1010000782466366216
  • Article Type
    journal article
  • Data Source
    • KAKEN

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