Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment
書誌事項
- タイトル
- Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment
- 著者
- M.-F. Wu, J.-L. Huang, X. Wen, K. Miyase
収録刊行物
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- IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems Vol.28,No.11
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IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems Vol.28,No.11 1767-1776, 2009