Depth Profiles of the Fermi Level at an Amorphous-Carbon Nitride/SiO_2/n-type-Si Heterojunction Interface Obtained by Kelvin Probe Force Microscopy
Bibliographic Information
- Title
- Depth Profiles of the Fermi Level at an Amorphous-Carbon Nitride/SiO_2/n-type-Si Heterojunction Interface Obtained by Kelvin Probe Force Microscopy
- Author
- Takahiro Ishizaki, Nagahiro Saito, Riichiro Ohta, Osamu Takai
Journal
-
- Diamond and Related Materials 15 (9)
-
Diamond and Related Materials 15 (9) 1378-1382, 2006
- Tweet
Details
-
- CRID
- 1010282256582653186
-
- Article Type
- journal article
-
- Data Source
-
- KAKEN