著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
佐藤 幸生,Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations,Applied Physics Letters 84・26,,,2004,,,5311-5313,https://cir.nii.ac.jp/crid/1010282256583180684,