著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,Power-constrained test scheduling for RTL datapaths of non-scan BIST schemes,Proceedings of the IEEE 13th Asian Test Symposium (ATS'04),,,2004,,,32-39,https://cir.nii.ac.jp/crid/1010282256769014528,