[Updated on Apr. 18] Integration of CiNii Articles into CiNii Research

A Test Generation Method for Path Delay Faults in Sequential Circuits with Discontinuous Reconvergence Structure

  • OHTAKE Satoshi
    NARA INSTITUTE OF SCIENCE AND TECHNOLOGY, GRAD. SCHOOL OF INFORMATION SCINCE, ASSISTANT PROFESSOR

Bibliographic Information

Title
A Test Generation Method for Path Delay Faults in Sequential Circuits with Discontinuous Reconvergence Structure
Author
Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara

Journal

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Details

  • CRID
    1010282256779021456
  • Article Type
    journal article
  • Data Source
    • KAKEN

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