A Test Generation Method for Path Delay Faults in Sequential Circuits with Discontinuous Reconvergence Structure
書誌事項
- タイトル
- A Test Generation Method for Path Delay Faults in Sequential Circuits with Discontinuous Reconvergence Structure
- 著者
- Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara
収録刊行物
-
- Trans, of IEICE (DI) (in Japanese) Vol.J86-D-I, No.12
-
Trans, of IEICE (DI) (in Japanese) Vol.J86-D-I, No.12 872-883, 2003