著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
,Quantitative Effects of Preferred Orientation and Impurity Phases on Ferroelectric Properties of SrBi_2(Ta_<1-x>Nb_x)2O_9 Thin Films by X-Ray Diffraction Reciprocal Space Mapping,Jpn.J.Appl.Phys. 42(2A),,,2003,,,539-543,https://cir.nii.ac.jp/crid/1010282256782477570,