[Updated on Apr. 18] Integration of CiNii Articles into CiNii Research

Building highly transferable interatomic models for atomistic simulation of device reliability

Bibliographic Information

Title
Building highly transferable interatomic models for atomistic simulation of device reliability
Author
Yoshitaka Umeno and Atsushi Kubo

Journal

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Details

  • CRID
    1010282256897133570
  • Article Type
    journal article
  • Data Source
    • KAKEN

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